TAILIEUCHUNG - Models in Hardware Testing- P3

Models in Hardware Testing- P3:Model based testing is one of the most powerful techniques for testing hardware and software moving forward to nanoscaled CMOS circuits, we observe a plethora of new defect mechanisms, which require increasing efforts in systematic fault modeling and appropriate algorithms for test generation, fault simulation and diagnosis. | 2 Models for Bridging Defects 49 the primary output. However all these vectors are not equivalent in terms of defect detection. Several points can be discussed. First it should be noted that some vectors have larger ADIs than others. For instance the ADI associated to vector 6 is larger than the ADI associated to vector 7. This means that vector 6 covers a larger range of detectable bridge resistance value than vector 7 . vector 6 is more efficient than vector 7 in terms of defect detection domain. The second point that should be noted is that some vectors have ADIs contained in the ADI of another vector whereas others have ADIs that cover different ranges. For instance the ADI associated to vector 2 is contained in the ADI associated to vector 6 whereas the ADIs associated to vector 2 and 7 are fully disjoint. Consequently regarding defect detection it is completely useless to use both vectors 2 and 6 while the use of both vectors 2 and 7 permits to cover a larger range of detectable bridge resistance value. In other words using several vectors may permit to enlarge the defect detection domain but these vector have to be adequately selected. Finally the last point that should be highlighted in the example of Table is that it exists a domain for the bridge resistance value that is not covered by any vector R4C 1 . Obviously such a domain must not be considered from the point of view of the optimization process. All these points can be generalized and formalized by introducing the concepts of Global-ADI and Covered-ADI. Definition . Given a circuit under test and the list of Analogue Detectability Intervals ADIV associated to each possible input vector V for a considered defect the Global Analogue Detectability Interval G-ADI is given by the union of all ADIs G - ADI ADIV The Global ADI represents the complete domain of the unpredictable parameter for which the defect can be detected considering the given test technique. On the example the G-ADI represents

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