TAILIEUCHUNG - Combining ability analysis for yield and spot blotch disease resistance in tetraploid wheat

The combining ability for yield and spot blotch disease resistance was studied in 21 cross combinations generated by crossing the selected spot blotch resistant and susceptible parents in 7 x 7 half half diallel design. Analysis of variance for combining ability indicated that SCA variance was higher than GCA variance for all the traits under study. The GCA component was significant for all the traits studied except for the trait thousand grain weight. The SCA component was significant for all the traits except for number of productive tillers per plant and thousand grain weight. The magnitude of sca variance was greater than gca variance for all the traits. | Combining ability analysis for yield and spot blotch disease resistance in tetraploid wheat

TỪ KHÓA LIÊN QUAN
Đã phát hiện trình chặn quảng cáo AdBlock
Trang web này phụ thuộc vào doanh thu từ số lần hiển thị quảng cáo để tồn tại. Vui lòng tắt trình chặn quảng cáo của bạn hoặc tạm dừng tính năng chặn quảng cáo cho trang web này.