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Progress in modern science is impossible without reliable tools for characterization of structural, physical, and chemical properties of materials and devices at the micro-, nano-, and atomic scale levels. While structural information can be obtained by such established techniques as scanning and transmission electron microscopy, high-resolution examination of local electronic structure, electric potential and chemical functionality is a much more daunting problem. | SCANNING PROBE MICROSCOPY Electrical and Electromechanical Phenomena at the Nanoscale Sergei Kalinin Alexei Gruverman EDITORS VOLUME 1 Springer SCANNING PROBE MICROSCOPY SCANNING PROBE MICROSCOPY ELECTRICAL AND ELECTROMECHANICAL PHENOMENA AT THE NANOSCALE Volume II Sergei Kalinin Alexei Gruverman .