TAILIEUCHUNG - SCANNING PROBE MICROSCOPY – PHYSICAL PROPERTY CHARACTERIZATION AT NANOSCALE

The invention of scanning tunneling microscope (STM) by Binnig and his colleagues in 1982 opened up the possibility of imaging material surfaces with spatial resolution much superior to the conventional microscopy techniques. The STM is the first instrument capable of directly obtaining three-dimensional images of solid surfaces with atomic resolution. Even though STM is capable of achieving atomic resolution, it can only be used on electrical conductors. This limitation has led to the invention of atomic force microscope (AFM) by Binnig and his co-workers in 1986. These techniques have the characteristic that their resolution is not determined by the wavelength that is used for the interaction as in. | SCANNING PROBE MICROSCOPY -PHYSICAL property SCANNING PROBE MICROSCOPY -PHYSICAL PROPERTY CHARACTERIZATION AT NANOSCALE Edited by Vijay Nalladega Scanning Probe Microscopy - Physical Property Characterization at Nanoscale Edited by Vijay Nalladega Published by InTech Janeza Trdine 9 51000 Rijeka Croatia Copyright 2012 InTech All chapters are Open Access distributed under the Creative Commons Attribution license which allows users to download copy and build upon published articles even for commercial purposes as long as the author and publisher are properly credited which ensures maximum dissemination and a wider impact of our publications. After this work has been published by InTech authors have the right to republish it in whole or part in any publication of which they are the author and to make other personal use of the work. Any republication referencing or personal use of the work must explicitly identify the original source. As for readers this license allows users to download copy and build upon published chapters even for commercial purposes as long as the author and publisher are properly credited which ensures maximum dissemination and a wider impact of our publications. Notice Statements and opinions expressed in the chapters are these of the individual contributors and not necessarily those of the editors or publisher. No responsibility is accepted for the accuracy of information contained in the published chapters. The publisher assumes no responsibility for any damage or injury to persons or property arising out of the use of any materials instructions methods or ideas contained in the book. Publishing Process Manager Oliver Kurelic Technical Editor Teodora Smiljanic Cover Designer InTech Design Team First published April 2012 Printed in Croatia A free online edition of this book is available at Additional hard copies can be obtained from orders@ Scanning Probe Microscopy - Physical Property Characterization at .

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