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Tuyển tập các báo cáo nghiên cứu khoa học trên tạp chí khoa học vật lý quốc tế đề tài: Structural and Dielectric Properties of the Mn-Doped BaO-Nd2O3-4TiO2 System | Journal of Physical Science Vol. 20 2 13-22 2009 13 Structural and Dielectric Properties of the Mn-Doped BaO-Nd2O3-4TiO2 System Srimala Sreekantan Chong Tun Shin and Ahmad Fauzi Mohd Noor School of Materials and Mineral Resources Engineering Universiti Sains Malaysia 14300 Nibong Tebal Pulau Pinang Malaysia Corresponding author srimala@eng.usm.my Abstract The effect of the Nd2O3 and TiO2 ratios on the microstructure dielectric properties and quality factor Q.fr of the 1 wt Mn-doped BaO-Nd2O3-4TiO2 system were investigated. The samples sintered at various temperatures were analysed by field emission scanning electron microscopy FESEM X-ray diffraction XRD and a network analyser at 3 GHz. The grains of the Nd2O3 poor composition MBN0.5T4 were more spherical whereas the grains of the excess Nd2O3 composition MBN1.5T4 were spherical and rod-like. The grains of the TiO2 poor composition MBNT4 and the TiO2 rich composition MBNT5 were more rod-like than spherical. The grain size increased with increasing sintering temperature. The BaNd2Ti5O14 phase was observed for compositions based on a BaO Nd2O3 1 ratio. The composition that deviated from the BaO Nd2O3 1 ratio was composed of a major phase BaNd2Ti5O14 with some secondary phases Nd2Ti2O7 and BaTi4O9. The formation of the secondary phases affects the density dielectric properties and quality factor of the Mn-doped BaO-Nd2O3-4TiO2 system. The dielectric constant varies from 35-85 with different Nd2O3 and TiO2 contents. Quality factor values of4200 to 10500 at 3 GHz can be obtained by varying the Nd2O3 and TiO2 contents. Keywords Mn dielectric properties quality factor BaO-Nd2O3-4TiO2 Abstrak Kesan nisbah Nd2O3 and TiO2 ke atas mikrostruktur sifat dielektrik dan faktor kualiti Q.fr 1 berat Mn-dop BaO-Nd2O3-4TiO2 telah dikaji. Sampel yang disinter pada pelbagai suhu dianalisa dengan menggunakan mikroskop elektron imbasan FESEM teknik pebelauan sinar-X XRD dan penganalisis rangkaian pada 3 GHZ. Butiran bagi sistem MBN0.5T4 .
