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Surface science was revolutionized in 1982 by the invention of the scanning tunneling microscope (STM) by Binnig and Rohrer who received the Nobel prize only 4 years later in 1986 [1]. Shortly after the invention, the first images showing atomic resolution on a Si(111) 7 7 surface were obtained. As this allowed real space imaging of atomic structure, it gave a new turn on nanotechnology research. By means of its working principle, namely the quantum mechanical tunneling current, the STM is inherently limited to the study of conducting surfaces. In 1986, the invention of the atomic force microscope (AFM) solved this limitation by using a tip supported by a. | Springer Series in Surface Sciences Sascha Sadewasser Thilo Glatzel Editors Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces Springer springer series in surface sciences 48 springer series in surface sciences Series Editors G. Ertl H. Luth and D.L. Mills This series covers the whole spectrum of surface sciences including structure and dynamics of clean and adsorbate-covered surfaces thin f ilms basic surface effects analytical methods and also the physics and chemistry of interfaces. Written by leading researchers in the field the books are intended primarily for researchers in academia and industry and for graduate students. Please view available titles in Springer Series in Surface Sciences on series homepage http www.springer.com series .