tailieuchung - Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize

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Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize

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Northern corn leaf blight (NCLB) caused by Exserohilum turcicum is a destructive disease in maize. Using host resistance to minimize the detrimental effects of NCLB on maize productivity is the most cost-effective and appealing disease management strategy. | Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize

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Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize

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Đang chuẩn bị liên kết để tải về tài liệu: Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize