TAILIEUCHUNG - Aerospace Technologies Advancements 2012 Part 5

Tham khảo tài liệu 'aerospace technologies advancements 2012 part 5', kỹ thuật - công nghệ, cơ khí - chế tạo máy phục vụ nhu cầu học tập, nghiên cứu và làm việc hiệu quả | 110 Aerospace Technologies Advancements 10-12 cm2 FPGA could be fundamentally due to the very little SEE sensitivity to protons of the A3P FPGA. Heavy ion data is hence required to confirm that no catastrophic failures could result from programming and erasing in beam since the FPGA s SEE sensitivities under HI irradiation are much higher relative to the proton sensitivity. Testing beyond the TID limit Most of the collected data for the measurements of the SEE cross-sections in this chapter has been obtained for TID less than 25 Krad in gamma-rays. Data provided in the Section 3 showed the TID performance of this device to be 16 Krad for the programming and erase circuitry and 22 Krad for the FPGA core itself the FG cells . For the latter the TID performance was mainly obtained when a degradation of 10 in the propagation delay of the logic tiles configured as a chain of buffers is attained but no permanent damage on the FPGA was noted. The purpose of this new specific test is to check the designs functionality and their SEE performance for TID higher than 25 Krad as well as the maximum TID to which the design is still functional. The SRAM test design was selected for this study since it uses various resources of the FPGA of the FPGA logic tiles configured as combinational or sequential logic 100 of the embedded SRAM memories the embedded PLL and FROM and 44 of the IOs. This design was also selected because of the SRAM high SEE sensitivity compared to the other FPGA resources which could help monitoring the functionality and the SEE cross-sections if they do increase. The DUT was exposed to beam for 5 consecutive runs each at a fluence of 4x1010 of MeV proton particles. This corresponds approximately to a TID of 15 Krad per run and to a total of 75 Krad for the five runs. During all these runs the DUT design was functional and the error cross-section per run was consistent without any noticeable increase in the SEE sensitivities as shown in Table 4. It

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