TAILIEUCHUNG - Multisensor thiết bị đo đạc thiết kế 6o (P1)

PROCESS, QUANTUM, AND ANALYTICAL SENSORS INTRODUCTION Automatic test systems, manufacturing process control, analytical instrumentation, and aerospace electronic systems all would have diminished capabilities without the availability of contemporary computer integrated data systems with multisensor information structures. This text develops supporting quantitative error models that enable a unified performance evaluation for the design and analysis of linear and digital instrumentation systems with the goal of compatibility of integration with other enterprise quality representations | Multisensor Instrumentation 6a Design. By Patrick H. Garrett Copyright 2002 by John Wiley Sons Inc. ISBNs 0-471-20506-0 Print 0-471-22155-4 Electronic 1 PROCESS QUANTUM AND ANALYTICAL SENSORS 1-0 INTRODUCTION Automatic test systems manufacturing process control analytical instrumentation and aerospace electronic systems all would have diminished capabilities without the availability of contemporary computer integrated data systems with multisensor information structures. This text develops supporting quantitative error models that enable a unified performance evaluation for the design and analysis of linear and digital instrumentation systems with the goal of compatibility of integration with other enterprise quality representations. This chapter specifically describes the front-end electrical sensor devices for a broad range of applications from industrial processes to scientific measurements. Examples include environmental sensors for temperature pressure level and flow in situ sensors for measurements beyond apparatus boundaries including spectrometers for chemical analysis and ex situ analytical sensors for manufactured material and biomedical assays such as microwave microscopy. Hyperspectral sensing of both spatial and spectral data is also introduced for improved understanding through feature characterization. It is notable that owing to advancements in higher attribution sensors they are increasingly being substituted for process models in many applications. 1-1 INSTRUMENTATION ERROR REPRESENTATION In this text error models are derived employing electronic device circuit and system parameter values that are combined into a unified end-to-end performance representation for computer-based measurement and control instrumentation. This methodology enables system integration beneficial to contemporary technologies ranging from micromachines to distributed processes. Since the baseline performance of machines and processes can be described by their internal .

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