TAILIEUCHUNG - Investigation of thermodynamic properties of metal thin film by statistical moment method
The thermodynamic properties of the metal thin film with face-centered cubic structure at zero pressure are investigated using the statistical moment method (SMM), including the anharmonicity effects of thermal lattice vibrations. The Helmholtz free energy, linear thermal expansion coefficients, specific heats at the constant volume and those at the constant pressure, CV and Cp are derived in closed analytic forms in terms of the power moments of the atomic displacements. Numerical calculations for thermodynamic quantities of Al, Au and Ag thin films are found to be in good agreement with those of the other theoretical results and experimental data. | Communications in Physics, Vol. 23, No. 4 (2013), pp. 301-312 INVESTIGATION OF THERMODYNAMIC PROPERTIES OF METAL THIN FILM BY STATISTICAL MOMENT METHOD VU VAN HUNG Vietnam Education Publishing House, 81 Tran Hung Dao, Hanoi, Vietnam DUONG DAI PHUONG Hanoi National University of Education, 136 Xuan Thuy Street, Hanoi, Vietnam NGUYEN THI HOA Fundamental Science Faculty, University of Transport and Communications, Lang Thuong, Dong Da, Hanoi, Vietnam Received 28 September 2013 Accepted for publication 20 December 2013 Abstract. The thermodynamic properties of the metal thin film with face-centered cubic structure at zero pressure are investigated using the statistical moment method (SM M ), including the anharmonicity effects of thermal lattice vibrations. The Helmholtz free energy, linear thermal expansion coefficients, specific heats at the constant volume and those at the constant pressure, CV and Cp are derived in closed analytic forms in terms of the power moments of the atomic displacements. Numerical calculations for thermodynamic quantities of Al, Au and Ag thin films are found to be in good agreement with those of the other theoretical results and experimental data. I. INTRODUCTION Materials in the form of thin films have become quite interesting for recent years. They have been found to show different physical, chemical, and mechanical properties from the corresponding bulk materials [1,2]. Properties, limitations and advantages obtained on thin films geometry have been widely studied, and they were found to depend on different factors: structure, size, film thickness, different substrates, . [2, 3]. Thin films are used in a vast range of applications such as microelectromechanical and nanoelectromechanical systems [4], sensors and electronic textiles [5], . Metal thin film is a common geometry and presents enormous scientific interests, mainly due to their attractive novel properties for technological applications [4, 5]. In the early of the .
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